TY  - BOOK
AU  - Moeck,Peter
AU  - Bridges,Frank George Baskerville
ED  - Symposium GG, "Electron Crystallography for Materials Research"
ED  - Symposium HH, "Quantitative Characterization of Nanostructured Materials"
TI  - Electron crystallography for materials research and quantitative characterization of nanostructured materials: symposia held April 14-16, 2009, San Francisco, California, USA 
T2  - Materials Research Society symposium proceedings
SN  - 9781605111575 (hbk.)
AV  - QD906.7.E37 S96 2009 S96 2009
PY  - 2009///
CY  - Warrendale, Pa.
PB  - Materials Research Society
KW  - Crystallography
KW  - Congresses
KW  - Electron microscopy
KW  - Nanocrystals
N1  - "Symposium GG, 'Electron Crystallography for Materials Research,' held April 13-14 at the 2009 MRS Spring Meeting in San Francisco, California"--P. [ix]; "Symposium HH, 'Quantitative Characterization of Nanostructured Materials,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California"-- P. [xi]; Includes bibliographical references and indexes
ER  -